Title

Single image DC-removal method for increasing the precision of two-dimensional Fourier transform profilometry

Department/School

Mathematics

Date

12-10-2013

Document Type

Article

Published in

Single image DC-removal method for increasing the precision of two-dimensional Fourier transform profilometry, Patent # US8605150B1

Citation/Other Information

Höft, T. (2013). Single image DC-removal method for increasing the precision of two-dimensional Fourier transform profilometry, Patent # US8605150B1, U.S. Patent and Trademark Office, Dec. 10, 2013.

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